Open AccessA Short Review on Raman Studies of Metal Chalcogenide Semiconductor Thin Films
Author(s) -
Ho Soonmin,
Mohd Hafiz Dzarfan Othman,
Mohd Ridhwan Adam,
K. Mohanraj
Publication year - 2021
Publication title -
asian journal of chemistry/asian journal of chemistry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.145
H-Index - 34
eISSN - 0975-427X
pISSN - 0970-7077
DOI - 10.14233/ajchem.2021.23112
Subject(s) - chalcogenide , raman spectroscopy , raman scattering , thin film , semiconductor , optoelectronics , chemistry , amorphous solid , absorption (acoustics) , optics , analytical chemistry (journal) , nanotechnology , materials science , physics , crystallography , chromatography
The productions of the thin metallic chalcogenide films are of particular interest for the wide range offabrication of the solar cells, sensors, photodiode arrays, photoconductors. Raman spectroscopy isused to measure the scattering radiation of a matter. Basically, the spectroscopic methods can bedefined as the study of the interaction of electromagnetic radiation with a matter. It can be based onthe phenomenon of absorption, fluorescence, emission or scattering. The observation of peaks supportedthe formation of amorphous or crystalline nature of the samples. In this short review, the authors hadgathered some informations about the Raman studies of recently synthesized metal chalcogenidesemiconductor thin films.