
Growth, Linear and Non-Linear, Dielectrics, Microhardness, Refractive Index and Laser Damage Threshold Studies on Urea Phosphoric Acid Single Crystal
Author(s) -
N. Hema,
R. Usha,
D. Shalini,
V. Revathi Ambika,
D. Jayalakshmi
Publication year - 2017
Publication title -
asian journal of chemistry/asian journal of chemistry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.145
H-Index - 34
eISSN - 0975-427X
pISSN - 0970-7077
DOI - 10.14233/ajchem.2017.20332
Subject(s) - chemistry , refractive index , phosphoric acid , indentation hardness , urea , dielectric , index (typography) , single crystal , laser , analytical chemistry (journal) , optics , crystallography , optoelectronics , organic chemistry , microstructure , materials science , physics , world wide web , computer science