Open AccessSurface Sensitivity and Detection Depth for Electron Spectroscopy
Author(s) -
Shigeo Tanuma
Publication year - 2022
Publication title -
vacuum and surface science
Language(s) - English
Resource type - Journals
eISSN - 2433-5843
pISSN - 2433-5835
DOI - 10.1380/vss.65.102
Subject(s) - inelastic mean free path , sensitivity (control systems) , x ray photoelectron spectroscopy , attenuation , electron , surface (topology) , spectroscopy , inelastic scattering , mean free path , scattering , measure (data warehouse) , attenuation length , materials science , computational physics , chemistry , atomic physics , physics , optics , nuclear magnetic resonance , mathematics , computer science , nuclear physics , geometry , quantum mechanics , data mining , electronic engineering , engineering
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