Enhancement of Intact Ion Yields in ToF-SIMS Using Molecular Cluster Ion Beams
Author(s) -
Kousuke Moritani
Publication year - 2018
Publication title -
vacuum and surface science
Language(s) - English
Resource type - Journals
eISSN - 2433-5843
pISSN - 2433-5835
DOI - 10.1380/vss.61.452
Subject(s) - ion , cluster (spacecraft) , projectile , ionization , chemistry , molecule , secondary ion mass spectrometry , chemical ionization , polyatomic ion , atomic physics , analytical chemistry (journal) , materials science , chromatography , physics , organic chemistry , computer science , metallurgy , programming language
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