Open AccessEffect of Trapped Charges on Local Potential Measurement of Carbon Nanotubes Using Frequency-Modulation Kelvin-Probe Force Microscopy
Author(s) -
Masanao Ito,
Yoshihiro Hosokawa,
Ryuji Nishi,
Yuji Miyato,
Kei Kobayashi,
Kazumi Matsushige,
Hirofumi Yamada
Publication year - 2011
Publication title -
e-journal of surface science and nanotechnology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.228
H-Index - 23
ISSN - 1348-0391
DOI - 10.1380/ejssnt.2011.210
Subject(s) - kelvin probe force microscope , carbon nanotube , materials science , silicon , electrode , microscopy , electrostatic force microscope , oxide , optoelectronics , nanotechnology , scanning probe microscopy , optics , chemistry , atomic force microscopy , physics , metallurgy
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