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Atomic Force Microscopy: A New Look at Pathogens
Author(s) -
David Alsteens,
Audrey Beaussart,
Sofiane El-Kirat-Chatel,
Ruby May A. Sullan,
Yves F. Dufrêne
Publication year - 2013
Publication title -
plos pathogens
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 3.719
H-Index - 206
eISSN - 1553-7374
pISSN - 1553-7366
DOI - 10.1371/journal.ppat.1003516
Subject(s) - cantilever , microscopy , resolution (logic) , nanotechnology , scanning ion conductance microscopy , materials science , fluorescence microscope , electron microscope , atomic force microscopy , optics , biophysics , chemistry , scanning confocal electron microscopy , fluorescence , physics , biology , computer science , artificial intelligence , composite material

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