Open AccessPreparation of hybrid samples for scanning electron microscopy (SEM) coupled to focused ion beam (FIB) analysis: A new way to study cell adhesion to titanium implant surfaces
Author(s) -
Ludovica Parisi,
Andrea Toffoli,
Benedetta Ghezzi,
Paola Lagonegro,
Giovanna Trevisi,
Guido Maria Macaluso
Publication year - 2022
Publication title -
plos one
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.99
H-Index - 332
ISSN - 1932-6203
DOI - 10.1371/journal.pone.0272486
Subject(s) - materials science , titanium , focused ion beam , scanning electron microscope , nanotechnology , sample preparation , adhesion , biomedical engineering , microscopy , ion , composite material , optics , chemistry , medicine , physics , organic chemistry , chromatography , metallurgy
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