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Characterization of Quaternary Metal Oxide Films by Synchrotron X-ray Fluorescence Microprobe
Author(s) -
Dale L. Perry,
A. C. Thompson,
R. E. Russo,
Xianglei Mao,
Karen L. Chapman
Publication year - 1997
Publication title -
applied spectroscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.415
H-Index - 110
eISSN - 1943-3530
pISSN - 0003-7028
DOI - 10.1366/0003702971939749
Subject(s) - microprobe , oxide , synchrotron , materials science , electron microprobe , analytical chemistry (journal) , micrometer , x ray fluorescence , metal , characterization (materials science) , fluorescence , chemistry , inorganic chemistry , mineralogy , nanotechnology , metallurgy , optics , physics , chromatography

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