Open AccessCharacterization of cellophane birefringence due to uniaxial strain by focused surface plasmon microscopy
Author(s) -
Ipsita Chakraborty,
Hiroshi Kano
Publication year - 2021
Publication title -
osa continuum
Language(s) - English
Resource type - Journals
ISSN - 2578-7519
DOI - 10.1364/osac.417743
Subject(s) - birefringence , materials science , optics , cellophane , surface plasmon , interferometry , plasmon , composite material , optoelectronics , physics
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