Open AccessDeep-learning-based fringe-pattern analysis with uncertainty estimation
Author(s) -
Shijie Feng,
Chao Zuo,
Yan Hu,
Yixuan Li,
Qian Chen
Publication year - 2021
Publication title -
optica
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 5.074
H-Index - 107
ISSN - 2334-2536
DOI - 10.1364/optica.434311
Subject(s) - metrology , computer science , convolutional neural network , deep learning , artificial intelligence , reliability (semiconductor) , artificial neural network , machine learning , ground truth , measure (data warehouse) , repeatability , bayesian probability , pixel , phase (matter) , pattern recognition (psychology) , data mining , optics , statistics , mathematics , physics , power (physics) , quantum mechanics