Open AccessSoft x-ray imaging spectroscopy with micrometer resolution
Author(s) -
Jan O. Schunck,
Florian Döring,
Benedikt Rösner,
Jens Buck,
Robin Y. Engel,
Piter S. Miedema,
Sanjoy K. Mahatha,
Moritz Hoesch,
A. Petraru,
H. Kohlstedt,
C. Schüßler-Langeheine,
Kai Roßnagel,
Christian Dávid,
Martin Beye
Publication year - 2020
Publication title -
optica
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.074
H-Index - 107
ISSN - 2334-2536
DOI - 10.1364/optica.405977
Subject(s) - spectroscopy , optics , image resolution , materials science , detector , scattering , dimension (graph theory) , micrometer , resolution (logic) , absorption (acoustics) , sample (material) , physics , imaging spectroscopy , computer science , mathematics , quantum mechanics , pure mathematics , thermodynamics , artificial intelligence
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