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Soft x-ray imaging spectroscopy with micrometer resolution
Author(s) -
Jan O. Schunck,
Florian Döring,
Benedikt Rösner,
Jens Buck,
Robin Y. Engel,
Piter S. Miedema,
S. K. Mahatha,
Moritz Hoesch,
A. Petraru,
H. Kohlstedt,
Christian SchüßlerLangeheine,
Kai Roßnagel,
Christian Dávid,
Martin Beye
Publication year - 2021
Publication title -
optica
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.074
H-Index - 107
ISSN - 2334-2536
DOI - 10.1364/optica.405977
Subject(s) - spectroscopy , optics , dimension (graph theory) , detector , image resolution , scattering , materials science , sample (material) , physics , inelastic scattering , zone plate , imaging spectroscopy , micrometer , absorption (acoustics) , diffraction , mathematics , quantum mechanics , pure mathematics , thermodynamics

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