Open AccessDiffraction-suppressed high-resolution imaging through metallodielectric nanofilms
Author(s) -
Simin Feng,
J. M. Elson
Publication year - 2006
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/opex.14.000216
Subject(s) - optics , materials science , diffraction , resolution (logic) , ptychography , physics , artificial intelligence , computer science
We show that diffraction-suppressed propagation of light can be achieved in one-dimensional multilayer metal-dielectric structure, leading to high-resolution imaging through metallodielectric nanofilms.