Open AccessBroadband supercontinuum interferometer for high-resolution profilometry
Author(s) -
David Reolon,
Maxime Jacquot,
Isabelle Verrier,
Gérald Brun,
Colette Veillas
Publication year - 2006
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/opex.14.000128
Subject(s) - supercontinuum , optics , interferometry , profilometer , materials science , white light interferometry , picosecond , resolution (logic) , broadband , photonic crystal fiber , optical fiber , physics , surface roughness , laser , computer science , artificial intelligence , composite material
In this paper, it is shown that a white light supercontinuum source generated in an air-silica microstructured optical fiber pumped with picosecond pulses offers the possibility to improve fringes visibility in interferometric acquisitions. Consequently, this source combined with a spectral interferometer, reaches high-resolution profilometric measurements. Phase calculation based on seven point algorithm can perform theoretically a subnanometer resolution. This method provides a one line profile of large surfaces from the analysis of a single shot image, without any mechanical scanning.