Broadband supercontinuum interferometer for high-resolution profilometry | Zendy

David Reolon | Zendy; Maxime Jacquot | Zendy; Isabelle Verrier | Zendy; G. Brun | Zendy; C. Veillas | Zendy

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Broadband supercontinuum interferometer for high-resolution profilometry

Author(s) -

David Reolon,

Maxime Jacquot,

Isabelle Verrier,

G. Brun,

C. Veillas

Publication year - 2006

Publication title -

optics express

Language(s) - Uncategorized

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/opex.14.000128

Subject(s) - supercontinuum , optics , interferometry , profilometer , materials science , white light interferometry , picosecond , resolution (logic) , broadband , photonic crystal fiber , optical fiber , physics , surface roughness , laser , computer science , artificial intelligence , composite material

In this paper, it is shown that a white light supercontinuum source generated in an air-silica microstructured optical fiber pumped with picosecond pulses offers the possibility to improve fringes visibility in interferometric acquisitions. Consequently, this source combined with a spectral interferometer, reaches high-resolution profilometric measurements. Phase calculation based on seven point algorithm can perform theoretically a subnanometer resolution. This method provides a one line profile of large surfaces from the analysis of a single shot image, without any mechanical scanning.

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