Open AccessOptical vortex metrology for nanometric speckle displacement measurement
Author(s) -
Wei Wang,
Tomoaki Yokozeki,
Reika Ishijima,
Atsushi Wada,
Yoko Miyamoto,
Mitsuo Takeda,
Steen Grüner Hanson
Publication year - 2006
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/opex.14.000120
Subject(s) - speckle pattern , metrology , optics , optical vortex , speckle noise , vortex , surface metrology , physics , speckle imaging , signal (programming language) , displacement (psychology) , computer science , profilometer , psychology , beam (structure) , quantum mechanics , surface roughness , psychotherapist , thermodynamics , programming language
As an alternative to correlation-based techniques widely used in conventional speckle metrology, we propose a new technique that makes use of phase singularities in the complex analytic signal of a speckle pattern as indicators of local speckle displacements. The complex analytic signal is generated by vortex filtering the speckle pattern. Experimental results are presented that demonstrate the validity and the performance of the proposed optical vortex metrology with nano-scale resolution.