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Role of metal film thickness on the enhanced transmission properties of a periodic array of subwavelength apertures
Author(s) -
Xiang Shou,
Amit Agrawal,
Ajay Nahata
Publication year - 2005
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/opex.13.009834
Subject(s) - materials science , optics , thin film , terahertz radiation , metal , transmission (telecommunications) , optoelectronics , physics , nanotechnology , engineering , electrical engineering , metallurgy
We have measured the enhanced transmission properties of periodic arrays of subwavelength apertures fabricated in thin metal films as a function of the metal film thickness. In doing so, we determine the minimum metal film thickness for an array that exhibits resonantly enhanced transmission and observe the transmission properties as the metal film thickness is increased. The thickness range explored extends from delta/15, where delta is the skin depth, to approximately 2delta. Using terahertz time-domain spectroscopy, we measure both the amplitude and phase of the transmitted broadband THz pulses. Experimentally, we find that there is negligible transmission enhancement for metal films as thin as delta/15. As the film thickness increases, there is a sublinear increase in the enhancement until the film thickness is equal to the skin depth. For metal films thicker than one skin depth, there appears to be little additional enhancement at the resonant frequencies. We also observe that as the thickness of metal films increases, there is a corresponding increase in the resonance frequencies.

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