Open AccessExperimental verification of fault tolerant quantum key distribution protocol
Author(s) -
Yun-Kun Jiang,
XiangBin Wang,
BaoSen Shi,
Akira Tomita
Publication year - 2005
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/opex.13.009415
Subject(s) - quantum key distribution , qubit , polarization (electrochemistry) , physics , optics , parametric statistics , quantum , computer science , quantum mechanics , mathematics , chemistry , statistics
We have investigated fault tolerant quantum key distribution experimentally, using four polarization encoding two-qubit states generated by spontaneous parametric down conversion. Collective noises on polarization and phase were simulated by passing the states through a half wave plate and a quarter wave pate. Error rate was calculated by measuring the two-qubit states in three basis. Our results show that the protocol is tolerant under collective random unitary noise.