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Micro-characterisation of erbium-doped fibers using a Raman confocal microscope
Author(s) -
Fotios Sidiroglou,
S.T. Huntington,
Ann Roberts,
Gregory W Baxter
Publication year - 2005
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/opex.13.005506
Subject(s) - materials science , confocal , confocal microscopy , optics , erbium , microscope , raman spectroscopy , microscopy , doping , optoelectronics , physics
We demonstrate the application of a Fluorescence Intensity Confocal Optical Microscopy technique to the determination of the relative erbium ion distribution in optical fibers. As well as being able to acquire two dimensional profiles of the relative erbium ion distribution, this method can also provide valuable information on a sub-micron level regarding physical and optogeometric parameters of the examined samples.

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