Improvement of the optical coating process by cutting layers with sensitive monitoring wavelengths | Zendy

Cheng-Chung Lee | Zendy; Kai Wu | Zendy; Chien-Cheng Kuo | Zendy; ShengHui Chen | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

Improvement of the optical coating process by cutting layers with sensitive monitoring wavelengths

Author(s) -

Cheng-Chung Lee,

Kai Wu,

Chien-Cheng Kuo,

ShengHui Chen

Publication year - 2005

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/opex.13.004854

Subject(s) - optics , coating , wavelength , materials science , compensation (psychology) , process (computing) , optical coating , optoelectronics , computer science , physics , nanotechnology , psychology , psychoanalysis , operating system

For costly optical coatings, a precise monitoring method is necessary. A new monitoring method based on the selection of the most sensitive monitor wavelength is proposed. The most sensitive monitor wavelength is easy to find by a numerical analysis. The equation for the thickness compensation when a layer is over-shot or under-shot was derived. Several examples, including narrow-band pass filters, have been given to demonstrate that this new method is superior to the turning point method in the coating process.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research