Open AccessOptical breakdown for silica and silicon with double femtosecond laser pulses
Author(s) -
Yang Deng,
Xinhua Xie,
Hongting Xiong,
Yu Xin Leng,
Chang Cheng,
Hengchang Lu,
R. X. Li,
Zhizhan Xu
Publication year - 2005
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/opex.13.003096
Subject(s) - materials science , femtosecond , optics , laser , silicon , semiconductor , optoelectronics , dielectric , pulse (music) , femtosecond pulse shaping , physics , detector
The optical breakdown thresholds (OBTs) of typical dielectric and semiconductor materials are measured using double 40-fs laser pulses. By measuring the OBTs with different laser energy and different time delays between the two pulses, we found that the total energy of breakdown decrease for silica and increase for silicon with the increase of the first pulse energy.