Optical breakdown for silica and silicon with double femtosecond laser pulses | Zendy

Yueyue Deng | Zendy; Xinhua Xie | Zendy; Hongting Xiong | Zendy; Y. X. Leng | Zendy; Chuangxun Cheng | Zendy; Hengchang Lu | Zendy; R. X. Li | Zendy; Zhenzhu Xu | Zendy

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Optical breakdown for silica and silicon with double femtosecond laser pulses

Author(s) -

Yueyue Deng,

Xinhua Xie,

Hongting Xiong,

Y. X. Leng,

Chuangxun Cheng,

Hengchang Lu,

R. X. Li,

Zhenzhu Xu

Publication year - 2005

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/opex.13.003096

Subject(s) - materials science , femtosecond , optics , laser , silicon , semiconductor , optoelectronics , dielectric , pulse (music) , femtosecond pulse shaping , physics , detector

The optical breakdown thresholds (OBTs) of typical dielectric and semiconductor materials are measured using double 40-fs laser pulses. By measuring the OBTs with different laser energy and different time delays between the two pulses, we found that the total energy of breakdown decrease for silica and increase for silicon with the increase of the first pulse energy.

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