Open AccessEnhancement of shear-force sensitivity using asymmetric response of tuning forks for near-field scanning optical microscopy
Author(s) -
Jang Hoon Yoo,
J. H. Lee,
SangYoup Yim,
Seung Han Park,
Myong Do Ro,
Joo Ho Kim,
In Sik Park,
Kyuman Cho
Publication year - 2004
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/opex.12.004467
Subject(s) - tuning fork , optics , near field scanning optical microscope , materials science , sensitivity (control systems) , resonance (particle physics) , optical microscope , microscopy , non contact atomic force microscopy , signal (programming language) , optoelectronics , physics , acoustics , vibration , scanning electron microscope , kelvin probe force microscope , computer science , particle physics , electronic engineering , programming language , engineering
Resonance characteristics of a tuning fork are investigated to enhance the shear-force detection sensitivity for near-field scanning optical microscopy. In particular, we show that the asymmetric frequency response of a tuning fork can be utilized to increase quality factors and suppress the background feedback signal. The pinning down effect on one side of the main peak can readily elevate vertical sensitivity and stability. A simplified model based on a coupled harmonic oscillator is presented to describe the asymmetric resonance behavior of the tuning fork. We also show improved topographic images of a blue-ray disc and optical images of a chromium pattern on the quartz using the asymmetric resonance.