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Solid-state carrier-envelope-phase noise measurements with intrinsically balanced detection
Author(s) -
Peter A. Roos,
Xiaoqin Li,
Jessica A. Pipis,
Steven T. Cundiff
Publication year - 2004
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/opex.12.004255
Subject(s) - carrier envelope phase , optics , interference (communication) , phase noise , phase (matter) , noise (video) , envelope (radar) , physics , materials science , sapphire , phase modulation , laser , optoelectronics , telecommunications , computer science , channel (broadcasting) , radar , quantum mechanics , artificial intelligence , image (mathematics)
We use interference between single- and two-photon photocurrent generation pathways in a semiconductor to measure the out-of-loop carrier-envelope-phase noise of a stabilized Ti:sapphire modelocked laser. This solid-state measurement technique exhibits no significant amplitude/phase coupling, adds no measurable phase noise compared to the standard self-referencing technique, and requires few optical components. The method features a built-in balanced detection mechanism that is particularly appealing for dc carrier-envelope-phase measurements.

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