Open AccessThermal oxide based silica ridge waveguide
Author(s) -
Dawei Zheng,
Joan Fong,
Zhian Shao,
Yong Lian,
Chuanfang Wu
Publication year - 2004
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/opex.12.001753
Subject(s) - materials science , waveguide , optics , planar , refractive index , thermal , ridge , oxide , layer (electronics) , optoelectronics , composite material , paleontology , physics , computer graphics (images) , meteorology , computer science , metallurgy , biology
A silica planar waveguide structure, where a ridge waveguide resides on a vacuum gap, was invented. The silica layer, which was fabricated through thermal oxidation at 1150 masculineC, had an excellent optical index uniformity on the order of 3x10(-5) @1550 nm, and a thickness uniformity of 10 nm at a thickness of 10 microm. Straight waveguide with low insertion loss was demonstrated. Improved thermal efficiency of this structure to cause phase change was discussed in comparison to the conventional channel waveguide structure. Finally, the limitation of this technology to make complex device structures was also explored.