
Optical constants of evaporated amorphous zinc arsenide (Zn3As2) via spectroscopic ellipsometry
Author(s) -
J. Colter Stewart,
Micah Shelley,
Nathan R. Schwartz,
Spencer K. King,
Daniel W. Boyce,
James Erikson,
David D. Allred,
John Colton
Publication year - 2019
Publication title -
optical materials express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.9.004677
Subject(s) - materials science , zinc , ellipsometry , zinc compounds , gallium arsenide , refractive index , optoelectronics , amorphous solid , optics , analytical chemistry (journal) , thin film , nanotechnology , crystallography , chemistry , metallurgy , physics , chromatography