Open AccessOptical constants of evaporated amorphous zinc arsenide (Zn3As2) via spectroscopic ellipsometry
Author(s) -
J. Colter Stewart,
Micah Shelley,
Nathan R. Schwartz,
Spencer K. King,
Daniel W. Boyce,
James Erikson,
David D. Allred,
John Colton
Publication year - 2019
Publication title -
optical materials express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.9.004677
Subject(s) - materials science , amorphous solid , ellipsometry , gallium arsenide , band gap , amorphous silicon , zinc , arsenide , silicon , analytical chemistry (journal) , thin film , optics , optoelectronics , crystalline silicon , crystallography , chemistry , nanotechnology , metallurgy , physics , chromatography
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