Open AccessExtraction of medium-spatial-frequency interfacial waviness and inner structure from X-ray multilayers using the speckle scanning technique
Author(s) -
Hui Jiang,
Shuai Yan,
Naxi Tian,
Dawei Liang,
Dong Zeng,
Yi Zheng
Publication year - 2019
Publication title -
optical materials express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.9.002878
Subject(s) - waviness , materials science , optics , speckle pattern , spatial frequency , extraction (chemistry) , physics , composite material , chemistry , chromatography