Open AccessExtraction of medium-spatial-frequency interfacial waviness and inner structure from X-ray multilayers using the speckle scanning technique
Author(s) -
Hui Jiang,
Shuai Yan,
Naxi Tian,
Dongxu Liang,
Zhaohui Dong,
Yi Zheng
Publication year - 2019
Publication title -
optical materials express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.9.002878
Subject(s) - waviness , optics , materials science , speckle pattern , penetration depth , spatial frequency , scattering , reflection (computer programming) , physics , computer science , composite material , programming language
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