Open AccessUnderstanding aging in chalcogenide glass thin films using precision resonant cavity refractometry
Author(s) -
Sarah Geiger,
Qingyang Du,
Bin Huang,
Mikhail Y. Shalaginov,
Jérôme Michon,
Hongtao Lin,
Tian Gu,
Anupama Yadav,
Kathleen Richardson,
Xinqiao Jia,
Juejun Hu
Publication year - 2019
Publication title -
optical materials express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.9.002252
Subject(s) - refractometry , materials science , optics , chalcogenide glass , chalcogenide , optoelectronics , refractive index , thin film , nanotechnology , physics