Open AccessUnderstanding aging in chalcogenide glass thin films using precision resonant cavity refractometry
Author(s) -
Sarah Geiger,
Qingyang Du,
Bin Huang,
Mikhail Y. Shalaginov,
Jérôme Michon,
Hongtao Lin,
Tian Gu,
Anupama Yadav,
Kathleen Richardson,
Xinqiao Jia,
Juejun Hu
Publication year - 2019
Publication title -
optical materials express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.9.002252
Subject(s) - refractometry , chalcogenide , materials science , chalcogenide glass , thin film , optics , optoelectronics , refractive index , nanotechnology , physics
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