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Determining the out-of-plane thermal expansion coefficient by analyzing the temperature dependence of thin-film interference fringes
Author(s) -
G. Beadie,
A. Rosenberg,
James S. Shirk
Publication year - 2019
Publication title -
optical materials express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.9.001430
Subject(s) - materials science , interference (communication) , optics , thermal expansion , thin film , refractive index , thermal , optoelectronics , composite material , physics , nanotechnology , telecommunications , thermodynamics , channel (broadcasting) , computer science

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