Open AccessReliable modeling of ultrathin alternative plasmonic materials using spectroscopic ellipsometry [Invited]
Author(s) -
Ray Secondo,
Dhruv Fomra,
N. Izyumskaya,
V. Avrutin,
James N. Hilfiker,
Andrew Martin,
Ümit Özgür,
Nathaniel Kinsey
Publication year - 2019
Publication title -
optical materials express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.9.000760
Subject(s) - materials science , plasmon , ellipsometry , refractive index , optics , nanotechnology , optoelectronics , thin film , physics
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