Optical constants of restored and etched reduced graphene oxide: a spectroscopic ellipsometry study
Author(s) -
Yuhong Cao,
Ertao Hu,
Jie Xing,
Li Liu,
Tong Gu,
Jiajin Zheng,
Kehan Yu,
Wei Wei
Publication year - 2018
Publication title -
optical materials express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.9.000234
Subject(s) - graphene , materials science , raman spectroscopy , refractive index , ellipsometry , oxide , chemical vapor deposition , optoelectronics , absorption (acoustics) , analytical chemistry (journal) , optics , nanotechnology , thin film , chemistry , composite material , physics , metallurgy , chromatography
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