Layer-number dependent reflection spectra of MoS2 flakes on SiO2/Si substrate
Author(s) -
Xiaoli Li,
Yafang Shi,
Shuai Li,
Wei Shi,
WenPeng Han,
Chuan Zhou,
Xiaohui Zhao,
Baolai Liang
Publication year - 2018
Publication title -
optical materials express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.8.003082
Subject(s) - materials science , exciton , substrate (aquarium) , reflection (computer programming) , wavelength , spectral line , optoelectronics , layer (electronics) , interference (communication) , optics , nanotechnology , condensed matter physics , physics , telecommunications , oceanography , astronomy , computer science , programming language , geology , channel (broadcasting)
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom