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Polarization-dependent scattering properties of single-crystalline silicon nanocylindroids
Author(s) -
Zhiqin Li,
Yiqin Chen,
Xupeng Zhu,
Mengjie Zheng,
Fengliang Dong,
Peipei Chen,
Lihua Xu,
Weiguo Chu,
KeQiu Chen,
Huigao Duan
Publication year - 2018
Publication title -
optical materials express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.8.000503
Subject(s) - materials science , silicon , light scattering , optics , mie scattering , scattering , nanostructure , refractive index , polarization (electrochemistry) , optoelectronics , lithography , electron beam lithography , nanophotonics , nanolithography , fabrication , nanotechnology , resist , chemistry , physics , medicine , alternative medicine , layer (electronics) , pathology

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