Open AccessQuality evaluation of homopetaxial 4H-SiC thin films by a Raman scattering study of forbidden modes
Author(s) -
Lei Wan,
Dishu Zhao,
Fangze Wang,
Gu Xu,
Tao Lin,
C. C. Tin,
Feng Zhang,
Zhe Chuan Feng
Publication year - 2017
Publication title -
optical materials express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.8.000119
Subject(s) - materials science , raman scattering , raman spectroscopy , thin film , optics , scattering , optoelectronics , quality (philosophy) , nanotechnology , physics , quantum mechanics