Open AccessAnnealing effect in a nitrogen atmosphere on structural and optical properties of In_2Te_5 thin films
Author(s) -
Yafei Yuan,
Chunmin Liu,
Hai-Ou Li,
Yaopeng Li,
Xinran Cao,
Jing Su,
Ling Cheng,
Lihua Yuan,
Zhang Xia,
Jing Li
Publication year - 2017
Publication title -
optical materials express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.7.004147
Subject(s) - materials science , raman spectroscopy , ellipsometry , thin film , annealing (glass) , analytical chemistry (journal) , sputter deposition , diffractometer , band gap , free carrier absorption , attenuation coefficient , photoluminescence , optics , sputtering , silicon , optoelectronics , nanotechnology , scanning electron microscope , chemistry , composite material , physics , chromatography
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