
Polarization behavior of zinc oxide thin films studied by temperature dependent spectroscopic ellipsometry
Author(s) -
Robi Kurniawan,
Inge Magdalena Sutjahja,
Toto Winata,
Tun Seng Herng,
Jun Ding,
Andrivo Rusydi,
Yudi Darma
Publication year - 2017
Publication title -
optical materials express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.7.003902
Subject(s) - materials science , ellipsometry , zinc , polarization (electrochemistry) , thin film , oxide , optics , refractive index , optoelectronics , nanotechnology , chemistry , metallurgy , physics