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Low-index, smooth Al_2O_3 films by aqueous solution process
Author(s) -
Cory K. Perkins,
Ryan H. Mansergh,
Juan Carlos Ramos,
Charith E. Nanayakkara,
DeokHie Park,
Sara GobernaFerrón,
Lauren B. Fullmer,
Joshua T. Arens,
Maceo T. Gutierrez-Higgins,
Yolanda R. Jones,
Jonathon I. Lopez,
Thomas Rowe,
Danielle M. Whitehurst,
May Nyman,
Yves J. Chabal,
Douglas A. Keszler
Publication year - 2016
Publication title -
optical materials express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.7.000273
Subject(s) - materials science , fourier transform infrared spectroscopy , refractive index , transmission electron microscopy , aqueous solution , scanning electron microscope , ellipsometry , thin film , analytical chemistry (journal) , fabrication , copolymer , raman spectroscopy , surface roughness , optics , optoelectronics , nanotechnology , composite material , polymer , chemistry , organic chemistry , medicine , physics , alternative medicine , pathology

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