Open AccessAnnealing of deposited SiO_2 thin films: full-atomistic simulation results
Author(s) -
F. V. Grigoriev,
E. V. Katkova,
А.В. Сулимов,
В. Б. Сулимов,
Alexander V. Tikhonravov
Publication year - 2016
Publication title -
optical materials express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.6.003960
Subject(s) - annealing (glass) , materials science , thin film , refractive index , optics , composite material , optoelectronics , nanotechnology , physics
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