Open AccessCircular dichroism, surface-enhanced Raman scattering, and spectroscopic ellipsometry studies of chiral polyfluorene-phenylene films
Author(s) -
Geon Joon Lee,
Eun Ha Choi,
Won Kyu Ham,
Chang Kwon Hwangbo,
Min Ju Cho,
Dong Hoon Choi
Publication year - 2016
Publication title -
optical materials express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.6.000767
Subject(s) - polyfluorene , materials science , polymer , ellipsometry , circular dichroism , raman scattering , chirality (physics) , raman spectroscopy , scattering , phenylene , photochemistry , thin film , optics , crystallography , nanotechnology , conjugated system , chemistry , chiral symmetry , physics , composite material , quantum mechanics , quark , nambu–jona lasinio model
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