Unique scattering patterns and reduced reflectance from Bessel’s rough surfaces
Author(s) -
Yubin Chen,
Chi-Chun Wu
Publication year - 2015
Publication title -
optical materials express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.5.001016
Subject(s) - optics , materials science , bessel function , scattering , planar , wavelength , light scattering , rough surface , silicon , reflectivity , autocorrelation , substrate (aquarium) , optoelectronics , physics , composite material , mathematics , statistics , computer graphics (images) , oceanography , computer science , geology
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