Open AccessMicro-structure analysis of He^+ ion implanted KTP by TEM
Author(s) -
Yujie Ma,
Fei Lu,
M. C. Ridgway,
Changdong Ma,
Bo Xu
Publication year - 2015
Publication title -
optical materials express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.5.000986
Subject(s) - materials science , transmission electron microscopy , annealing (glass) , ion implantation , fabrication , crystal structure , rutherford backscattering spectrometry , spectroscopy , lattice (music) , ion , optoelectronics , thin film , composite material , crystallography , nanotechnology , chemistry , physics , organic chemistry , medicine , alternative medicine , pathology , quantum mechanics , acoustics
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