Open AccessPhotoluminescence microscopy as a noninvasive characterization method for defects in gallium oxide and aluminum gallium oxide epitaxial films
Author(s) -
Jacqueline Cooke,
Praneeth Ranga,
Jani Jesenovec,
Arkka Bhattacharyya,
Xueling Cheng,
Yunshan Wang,
John S. McCloy,
Sriram Krishnamoorthy,
Michael A. Scarpulla,
Berardi SensaleRodriguez
Publication year - 2022
Publication title -
optical materials express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.474921
Subject(s) - photoluminescence , epitaxy , materials science , gallium , scanning electron microscope , crystallographic defect , metalorganic vapour phase epitaxy , microscopy , optical microscope , oxide , optoelectronics , thin film , characterization (materials science) , analytical chemistry (journal) , optics , crystallography , nanotechnology , composite material , chemistry , metallurgy , physics , layer (electronics) , chromatography