Photoluminescence microscopy as a noninvasive characterization method for defects in gallium oxide and aluminum gallium oxide epitaxial films | Zendy

Jacqueline Cooke | Zendy; Praneeth Ranga | Zendy; Jani Jesenovec | Zendy; Arkka Bhattacharyya | Zendy; Xueling Cheng | Zendy; Yunshan Wang | Zendy; John S. McCloy | Zendy; Sriram Krishnamoorthy | Zendy; Michael A. Scarpulla | Zendy; Berardi SensaleRodriguez | Zendy

Open Access

Photoluminescence microscopy as a noninvasive characterization method for defects in gallium oxide and aluminum gallium oxide epitaxial films

Author(s) -

Jacqueline Cooke,

Praneeth Ranga,

Jani Jesenovec,

Arkka Bhattacharyya,

Xueling Cheng,

Yunshan Wang,

John S. McCloy,

Sriram Krishnamoorthy,

Michael A. Scarpulla,

Berardi SensaleRodriguez

Publication year - 2022

Publication title -

optical materials express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.925

H-Index - 66

ISSN - 2159-3930

DOI - 10.1364/ome.474921

Subject(s) - photoluminescence , materials science , epitaxy , crystallographic defect , metalorganic vapour phase epitaxy , microscopy , scanning electron microscope , gallium , optical microscope , optoelectronics , oxide , thin film , characterization (materials science) , analytical chemistry (journal) , crystallography , optics , nanotechnology , composite material , chemistry , metallurgy , physics , layer (electronics) , chromatography

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