Open AccessZinc gallate (ZnGa2O4) epitaxial thin films: determination of optical properties and bandgap estimation using spectroscopic ellipsometry
Author(s) -
Samiran Bairagi,
ChingLien Hsiao,
Roger Magnusson,
Jens Birch,
Jinn P. Chu,
FuGow Tarntair,
RayHua Horng,
Kenneth Järrendahl
Publication year - 2022
Publication title -
optical materials express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.462668
Subject(s) - materials science , thin film , band gap , sapphire , ellipsometry , epitaxy , analytical chemistry (journal) , attenuation coefficient , chemical vapor deposition , optics , optoelectronics , nanotechnology , laser , chemistry , physics , layer (electronics) , chromatography
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