Determination of the far-infrared dielectric function of a thin InGaAs layer using a detuned Salisbury screen
Author(s) -
Tuan Nghia Le,
Jean-Luc Pélouard,
Fabrice Charra,
Simon Vassant
Publication year - 2022
Publication title -
optical materials express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.455445
Subject(s) - dielectric , raman spectroscopy , materials science , phonon , far infrared , optics , dielectric function , infrared , optoelectronics , thin film , physics , condensed matter physics , nanotechnology
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