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Spectroscopic ellipsometry of thin film cyclic olefin copolymer for use in long-wave infrared metasurfaces
Author(s) -
Jeffrey D’ Archangel,
Benjamin Cerjan,
Lou Deguzman,
Mark H. Griep,
Glenn D. Boreman
Publication year - 2021
Publication title -
optical materials express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.439317
Subject(s) - materials science , ellipsometry , infrared , optoelectronics , dielectric , optics , absorption (acoustics) , lithography , copolymer , layer (electronics) , dispersion (optics) , thin film , nanotechnology , composite material , polymer , physics

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