Open AccessFast recovery of ion-irradiation-induced defects in Ge2Sb2Te5 thin films at room temperature
Author(s) -
Martin Hafermann,
Robin Schock,
Chenghao Wan,
Jura Rensberg,
Mikhail A. Kats,
Carsten Ronning
Publication year - 2021
Publication title -
optical materials express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.439146
Subject(s) - materials science , amorphous solid , irradiation , annealing (glass) , crystallographic defect , vacancy defect , ion , hexagonal phase , van der waals force , thin film , crystallography , hexagonal crystal system , analytical chemistry (journal) , nanotechnology , composite material , chemistry , physics , organic chemistry , chromatography , molecule , nuclear physics