
XPS analysis of metallic trace contaminations on fused silica surfaces induced by classical optics manufacturing
Author(s) -
Robert Ε. Kohler,
Christoph Gerhard
Publication year - 2021
Publication title -
optical materials express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.436310
Subject(s) - materials science , polishing , cerium , impurity , grinding , x ray photoelectron spectroscopy , chemical state , metal , chemical engineering , metallurgy , chemistry , organic chemistry , engineering