Open AccessQuick and reliable colorimetric reflectometry for the thickness determination of low-dimensional GaS and GaSe exfoliated layers by optical microscopy
Author(s) -
Yael Gutiérrez,
Gonzalo Santos,
Maria M. Giangregorio,
Stefano Dicorato,
Fabio Palumbo,
J. M. Saiz,
Fernando Moreno,
María Losurdo
Publication year - 2021
Publication title -
optical materials express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.435157
Subject(s) - reflectometry , materials science , exfoliation joint , fabrication , gallium , optoelectronics , nanotechnology , optics , graphene , computer science , time domain , medicine , alternative medicine , physics , pathology , metallurgy , computer vision