Open AccessQuick and reliable colorimetric reflectometry for the thickness determination of low-dimensional GaS and GaSe exfoliated layers by optical microscopy
Author(s) -
Yael Gutiérrez,
Gonzalo Santos,
Maria M. Giangregorio,
Stefano Dicorato,
Fabio Palumbo,
J. M. Saiz,
Fernando Moreno,
María Losurdo
Publication year - 2021
Publication title -
optical materials express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.435157
Subject(s) - reflectometry , materials science , fabrication , exfoliation joint , gallium , optoelectronics , optics , microscopy , optical microscope , scanning electron microscope , nanotechnology , graphene , composite material , alternative medicine , physics , pathology , time domain , medicine , computer science , metallurgy , computer vision
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