Open AccessPolarization-dependent refractive index analysis for nanoporous microcavities by ray tracing of a propagating electromagnetic field
Author(s) -
Yoshiki Mikami,
Hiroaki Yoshioka,
Nasim Obata,
SangMin Han,
Yuji Oki
Publication year - 2021
Publication title -
optical materials express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.434394
Subject(s) - nanoporous , refractive index , materials science , lasing threshold , optics , polarization (electrochemistry) , laser , optoelectronics , electromagnetic radiation , physical optics , ray tracing (physics) , physics , nanotechnology , chemistry