Open AccessSynchrotron X-ray metrology of dopant distribution and oxidation state in high pressure CVD grown TM2+:ZnSe optical fibers
Author(s) -
Michael G. Coco,
Stephen C. Aro,
Alexander Hendrickson,
James P. Krug,
Barry Lai,
Zhonghou Cai,
Pier J. A. Sazio,
Sean A. McDaniel,
Gary Cook,
Venkatraman Gopalan,
John V. Badding
Publication year - 2021
Publication title -
optical materials express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.414201
Subject(s) - materials science , dopant , chemical vapor deposition , xanes , synchrotron , doping , synchrotron radiation , fiber , laser , optoelectronics , optics , analytical chemistry (journal) , spectroscopy , chemistry , physics , quantum mechanics , chromatography , composite material
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