
Topological transition from deeply sub- to near-wavelength ripples during multi-shot mid-IR femtosecond laser exposure of a silicon surface
Author(s) -
S. I. Kudryashov,
Theo Pflug,
N. I. Busleev,
Markus Olbrich,
Alexander Horn,
M. S. Kovalev,
Nikita Stsepuro
Publication year - 2020
Publication title -
optical materials express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.412790
Subject(s) - materials science , femtosecond , laser , optics , wavelength , silicon , trench , laser ablation , ablation , black silicon , optoelectronics , physics , nanotechnology , engineering , layer (electronics) , aerospace engineering