z-logo
open-access-imgOpen Access
Deposition and characterization of solution processed Se-rich Ge-Se thin films with specular optical quality using multi-component solvent approach
Author(s) -
Stanislav Šlang,
Karel Pálka,
Jiří Jančálek,
Michal Kurka,
Miroslav Vlček
Publication year - 2020
Publication title -
optical materials express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.408327
Subject(s) - thin film , materials science , surface roughness , refractive index , propylamine , chemical engineering , annealing (glass) , solvent , chalcogenide , spin coating , analytical chemistry (journal) , composite material , optoelectronics , nanotechnology , organic chemistry , chemistry , amine gas treating , engineering

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here