Open AccessDeposition and characterization of solution processed Se-rich Ge-Se thin films with specular optical quality using multi-component solvent approach
Author(s) -
Stanislav Šlang,
Karel Pálka,
Jiří Jančálek,
Michal Kurka,
Miroslav Vlček
Publication year - 2020
Publication title -
optical materials express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.408327
Subject(s) - thin film , materials science , refractive index , surface roughness , propylamine , annealing (glass) , chalcogenide , chemical engineering , solvent , analytical chemistry (journal) , optics , optoelectronics , composite material , nanotechnology , organic chemistry , chemistry , amine gas treating , engineering , physics
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