z-logo
open-access-imgOpen Access
Simple technique for determining the refractive index of phase-change materials using near-infrared reflectometry: publisher’s note
Author(s) -
Emanuele Gemo,
Sameer Vajjala Kesava,
Carlota Ruíz de Galarreta,
Liam Trimby,
Santiago Carrillo,
Moritz Riede,
Anna Baldycheva,
A. M. Alexeev,
C. David Wright
Publication year - 2020
Publication title -
optical materials express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.401837
Subject(s) - refractive index , reflectometry , materials science , optics , infrared , simple (philosophy) , phase change , optoelectronics , phase (matter) , engineering physics , computer science , physics , time domain , philosophy , epistemology , quantum mechanics , computer vision

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom